S.M.A.R.T.監視 - 結局、smartmontools

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ディスクのエラーに怯えるようになってS.M.A.R.T.の監視ツールを探したが、いいのがなかなかない。
けにあメモ: 再び IDEプライマリマスターのエラー

HDD Healthは表示が全然当てにならず、なんかやりたかった事とも違う。
Flash File Recovery, recovery software for Windows

ZAMOさんから教えてもらった奴は、とりあえずマニュアル落として、見てみた。
GUIで分かりやすく出来てるみたいで、良いんだけど。 この程度の事に数千円払うのも嫌だなあと。
PowerX Active SMART 2.5

で、今のところ気に入ったのが、smartmontools
UNIXベースのツールなので、PCしか使った事のない人には敷居が高いかも。
ディスクのエラー情報メール通知をするには、コマンドベースのメーラーが必要。
smartmontoolsのsmartd.confのmanページで参照されていたblatをインストール。
SourceForge.net: Blat - A Win32 Command Line SMTP Mailer

こいつらをノートPCに入れて、テストメールが来るのを確認。
後は、何か言ってくるのを待ってみるか。

smartctl -a hda
smartctl version 5.36 [i686-mingw32-xp-sp2] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model: HTS424040M9AT00
Serial Number: MPA228Q2F1JRGE
Firmware Version: MA2OA70A
User Capacity: 40,007,761,920 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a
Local Time is: Fri Sep 01 16:36:15 2006
SMART support is: Available - device has SMART capability.
Enabled status cached by OS, trying SMART RETURN STATUS cmd.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off supp
ort.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 37) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_
FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 095 095 062 Pre-fail Always -
720897
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline -
0
3 Spin_Up_Time 0x0007 149 149 033 Pre-fail Always -
1
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always -
865
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always -
0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always -
0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline -
0
9 Power_On_Hours 0x0012 097 097 000 Old_age Always -
1721
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always -
0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always -
800
191 G-Sense_Error_Rate 0x000a 099 099 000 Old_age Always -
65538
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always -
154
193 Load_Cycle_Count 0x0012 097 097 000 Old_age Always -
39572
194 Temperature_Celsius 0x0002 137 137 000 Old_age Always -
40 (Lifetime Min/Max 16/62)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always -
2
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always -
1
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline -
0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always -
2

SMART Error Log Version: 1
ATA Error Count: 11 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 11 occurred at disk power-on lifetime: 1721 hours (71 days + 17 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 85 ca 24 e4 Error: UNC 8 sectors at LBA = 0x0424ca85 = 69520005

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 85 ca 24 e4 00 04:34:10.200 READ DMA
ca 00 80 ad 51 83 e2 00 04:34:10.200 WRITE DMA
ca 00 80 15 51 83 e2 00 04:34:10.200 WRITE DMA
ca 00 80 fd 1d 83 e2 00 04:34:10.200 WRITE DMA
ca 00 80 3d 1d 83 e2 00 04:34:10.200 WRITE DMA

Error 10 occurred at disk power-on lifetime: 1721 hours (71 days + 17 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 85 ca 24 e4 Error: UNC 8 sectors at LBA = 0x0424ca85 = 69520005

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 85 ca 24 e4 00 04:34:05.700 READ DMA
ca 00 09 ef 82 b0 e1 00 04:34:05.700 WRITE DMA
ca 00 08 f7 6b 39 e1 00 04:34:05.700 WRITE DMA
ca 00 08 f7 67 39 e1 00 04:34:05.700 WRITE DMA
ca 00 08 5f ee 02 e1 00 04:34:05.700 WRITE DMA

Error 9 occurred at disk power-on lifetime: 1721 hours (71 days + 17 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 85 ca 24 e4 Error: UNC 8 sectors at LBA = 0x0424ca85 = 69520005

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 85 ca 24 e4 00 04:34:01.200 READ DMA
ca 00 08 ff 6b 39 e1 00 04:34:01.200 WRITE DMA
ca 00 08 7f f3 3a e0 00 04:34:01.200 WRITE DMA
c8 00 08 85 ca 24 e4 00 04:33:56.600 READ DMA
ca 00 50 4f 88 3a e1 00 04:33:56.600 WRITE DMA

Error 8 occurred at disk power-on lifetime: 1721 hours (71 days + 17 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 85 ca 24 e4 Error: UNC 8 sectors at LBA = 0x0424ca85 = 69520005

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 85 ca 24 e4 00 04:33:56.600 READ DMA
ca 00 50 4f 88 3a e1 00 04:33:56.600 WRITE DMA
ca 00 08 c7 f2 3a e0 00 04:33:56.600 WRITE DMA
ca 00 08 6f c9 37 e0 00 04:33:56.600 WRITE DMA
e7 00 00 00 00 00 a0 00 04:33:56.400 FLUSH CACHE

Error 7 occurred at disk power-on lifetime: 1721 hours (71 days + 17 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 85 ca 24 e4 Error: UNC 8 sectors at LBA = 0x0424ca85 = 69520005

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 85 ca 24 e4 00 04:33:52.000 READ DMA
ca 00 08 45 ce 72 e2 00 04:33:52.000 WRITE DMA
ca 00 08 a7 f2 3a e0 00 04:33:52.000 WRITE DMA
ca 00 08 6f c9 37 e0 00 04:33:52.000 WRITE DMA
c8 00 01 00 00 00 e0 00 04:33:52.000 READ DMA

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA
_of_first_error
# 1 Extended offline Completed without error 00% 1720 -
# 2 Short offline Completed without error 00% 1708 -

Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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About this Entry

This page contains a single entry by kenia published on 2006年9月 1日 21:17.

菊月夜 / 山本周五郎 was the previous entry in this blog.

ディスクエラー - smartmontoolsが駄目みたい? is the next entry in this blog.

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